total emissivity

[ˈtotl ˌɛmɪˈsɪvɪti][ˈtəutəl ˌemiˈsiviti]

总发射率

  • The total hemisphere emissivity at 90 ℃ and the normal spectral reflectance at room temperature of C / SiC composites were measured by using steady-state calorimeter method and Fourier infrared spectrometer ( FTIR ) respectively .

    利用稳态量热计法和傅里叶红外光谱仪分别测定了C/SiC复合材料在90℃时的半球 发射 和室温法向光谱反射率。

  • An Instrument for Measuring Total Emissivity of Materials Between 300 and 1000 ℃

    (300-1000)℃材料 波长 发射 测量装置的研究

  • The Measurement of Total Thermal Emissivity of a Solid Surface

    固体表面热 辐射 黑度)测定

  • The measurement of the total emissivity of a solid surface in the black cavity which is immersed in liquid nitrogen and under high vacuum ( 10-6 torr ) by steady caloric method is described .

    本文提出了一个真空度为10~(-6)毫米汞柱,黑体腔四周浸泡在液氮中的固体的表面热 辐射 的测定方法。

  • The influence of the degree of vacuum on the total emissivity is discussed .

    本文还分析了不同真空度对 辐射 的影响。

  • After 1h heating treatment in vacuum at 1600 ℃ the total hemisphere emissivity of C / SiC composites declined but SiC-C / SiC and polishing SiC-C / SiC increased remarkably .

    真空1600℃保温1h热处理后,无涂层C/SiC的 发射 有所降低;而SiC-C/SiC以及抛光SiC-C/SiC的半球 发射 明显上升。

  • An apparatus for measuring the hemispherical total emissivity ε h of the coatings and metals in the range of 1000 K-1800 K is described . The measured results of the ε h of some high temperature coatings are given .

    本文介绍了涂层及金属在1000K&1800K温度范围内的半球向 发射 测定装置,给出了几种高温涂层的半球向全 发射 数据。

  • An apparatus for measuring the hemispherical total emissivity of the high temperature coatings and metals

    高温涂层及金属的半球向 发射 测定装置

  • The normal total emissivity and refractoriness are more than 0.9 and 1790 ℃ respectively .

    其法向 发射 和耐火度分别超过0.9和1790℃。

  • To a straight wall with air natural convection the real temperature and total emissivity of the surface and the cold ambient temperature could he measured by the infra-red systems mentioned above so that the total heat flow of that surface may be determined .

    对于竖壁空气自然对流表面,用上述红外系统测量出该表面的真温度和 发射 以及冷环境温度,便可确定出该表面的全热流。

  • It can be used not only for the on-line measurement of total heat flow but also for the simultaneous measurements of true temperature and emissivity .

    用它不仅可以在线测量表面的 热流,而且还可同时测出被测表面的真实温度和 发射

  • The research on measurement of the total hemispherical emissivity

    半球向 发射 测定研究

  • Experimental research on total hemispherical emissivity of W and Ni in the range of 350 to 1000 K

    钨和镍在 350&1000K内的半球向 发射 的试验 测定